New Approaches and Novel Applications of Surface / Interface Analytical Methods Part II

4:00 PM • ASS-3-In-1 • NEW PEEM (DISPLAY-TYPE ELLIPSOIDAL MESH ANALYZER: DELMA) FOR PHOTOELECTRON HOLOGRAPHY AND STEREO-PHOTOGRAPH > H. Hiroshi Daimon 4:30 PM • ASS-3-Or-1 • In-situ oxidation of Au, Ag and Cu studied with Ambient Pressure Photoelectron Spectroscopy: An attempt to bridge the Pressure-Gap in Heterogeneous Catalysis > K. Kanak Roy 4:45 PM • ASS-3-Or-2 • UV Photoelectron Spectroscopy at Near Ambient Pressure in APPES > S. Subramanian Gopinath Chinnakonda 5:00 PM • ASS-3-Or-3 • Direct observation of layer-by-layer removal from Si(100) in hydrogen ambient by in situ spectroscopy > P. Peter Kleinschmidt 5:15 PM • ASS-3-Or-4 • GaN surface polarity determination by photoelectron diffraction > O. Oleksandr ROMANYUK 5:30 PM • ASS-3-Or-5 • Anomalous X-ray Scattering: A Chemically Selective Method To Investigate Supported Nanoalloys > A. Asseline Lemoine 5:45 PM • ASS-3-Or-6 • Effect of yttrium thin layers on the structural and optical properties of Co/Mo2C periodic multilayers > Y. Yanyan YUAN