New Approaches and Novel Applications of Surface / Interface Analytical Methods Part III / Characterisation of Nanomaterials

8:00 AM • ASS-5-Or-1 • Electrical phase transition of poly(4,4’-aminotriphenylene hexafluoroisopropylidenediphthalimide) by photogenerated charged carrier injection > K. Kyoung Jae LEE 8:15 AM • ASS-5-Or-2 • Novel Ion Sources for XPS Sputter Depth Profiling Advanced Materials > A. Adam ROBERTS 8:30 AM • ASS-5-Or-3 • Surface Spectrometry and Depth Profiling using Argon Cluster Ions > A. Adam Sears 8:45 AM • ASS-5-Or-4 • REDUCED PREFERENTIAL SPUTTERING OF TiO2 AND Ta2O5 USING ARGON CLUSTER ION BOMBARDMENT > M. mark baker 9:00 AM • ASS-5-Or-5 • Development of Ion Mapping for SIMS with an EEM > M. Michael Eller 9:15 AM • ASS-5-Or-6 • Ultra fast depth profile measurements of materials: GD OES and Plasma Profiling TOFMS, tools for thin and thick films characterisation > P. Patrick CHAPON 9:30 AM • ASS-5-Or-7 • Cooperative modulation of electronic structures of aromatic molecules coupled to multiple metal contacts > W. Weihua WANG 9:45 AM • BK • BREAK 10:15 AM • ASS-5-In-1 • Measuring molecular attachment to nanoparticles