Imaging Techniques (STM/STS/X-ray and electron imaging) (joint with ICN+T 2013) / Poster session #1
Tuesday, September 10, 2013
Journée des assistantes
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SS/NST-P1
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2:00 PM
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4:00 PM
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Imaging Techniques (STM/STS/X-ray and electron imaging) (joint with ICN+T 2013) / Poster session #1
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Poster Area 2 (Neuilly Aisle)
Journée des assistantes
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SS/NST-P1-01
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Modeling secondary electron emission in scanning He ion microscope; comparison with scanning Ga ion and electron microscopes
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K.
Kaoru
OHYA
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SS/NST-P1-02
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Experimental and computional insights at the molecular level of the p-nitroaniline solid-liquid interface
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P.
Peter
Spijker
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SS/NST-P1-03
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Edge and Interfacial States of a Two Dimensional Topological Insulator, a Bi(111) Bilayer/Bi2Te2Se
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S.
Sung Hwan
KIM
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SS/NST-P1-04
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XANAM measurements with a qplus sensor under X-ray irradiation
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S.
Shushi
Suzuki
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SS/NST-P1-05
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Electron orbital resolution in distance dependent STM experiments with tungsten tips
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O.
Olaf
LUEBBEN
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SS/NST-P1-06
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Secondary electron intensity dependence on the layer structure
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A.
Attila
Sulyok
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