Electronic Material and Processes / Poster session #3

• EMP-P3-01 • Advanced structural characterisation of micro- and nano-electronics using neutrons and synchrotron X-rays > E. Edward MITCHELL • EMP-P3-02 • Physical and electrical characteristics of Er2O3 and Er2TiO5 InGaZnO thin-film transistors > C-H. Ching-Hung Chen • EMP-P3-03 • Ultrasound influence on the Si-SiO2 system defects structure > D. Daniel KROPMAN • EMP-P3-04 • Air-Stable Organic Solar Cells with Ag/Pentacene Anode Buffer Layer > K. Kenji HARAFUJI • EMP-P3-05 • Structural and electrical characteristics of Ni/Lu2O3/TaN capacitors for analog IC applications > T-M. Tung-Ming Pan • EMP-P3-06 • Annealing of Cr/Au metallizations on p-GaN > L. László DOBOS • EMP-P3-07 • STRUCTURAL AND ELECTRICAL CHARACTERISATION OF a-Si:H(n)/c-Si(p) HETEROSTRUCTURES PREPARED BY ICP AND PECVD > J. jaroslav Kovac • EMP-P3-08 • S = 1 and S = 1/2 Kondo effects on atomic chains > L. Laercio Costa Ribeiro • EMP-P3-09 • Predefined structures in LED surface for modification of radiation characteristics > J. Jaroslava Skriniarova • EMP-P3-10 • Growth of Carbon Nanotubes inside a Silicon Via to Enable IC Stacking Applications > S. Susan Burkett • EMP-P3-11 • Dry etching of ZTO Films by using Inductively Coupled Plasma > H-S. Han-Soo Kim • EMP-P3-12 • Nonlinear charge transport in two-dimensional polymer monolayer > M. Megumi Akai-Kasaya • EMP-P3-13 • Segregation, oxygen vacancies and waterfall behaviour in SrTiO3 : A complete synchrotron radiation study > S. Suyeon CHO • EMP-P3-14 • Attempt to manufacture a solar cell by using a simple method of n-type doping of monocrystalline silicon > D. Diouma Kobor • EMP-P3-14a • Thin Single-crystalline Silicon Wafer with Thickness of 100 ㎛ for Photovoltaic Applications > B. Boyun Jang • EMP-P3-15 • Nickel nano-particle synthesis by reactive RF thermal plasma > H. Hanshin Choi • EMP-P3-16 • W-Cu thick film fabrication for thermal management > H. Hyunwoong Na • EMP-P3-17 • Maya Lakhdara / No Show • EMP-P3-18 • Hadj Yahia Seba / No Show • EMP-P3-18a • New anti-charging method for electron beam observation and lithography of insulating substrates > A. Abdel AASSIME